The Surface Characterization Suite supports basic and advanced investigations into materials, surfaces and particles. Investigate elemental and molecular composition and quantitative features for various material and compounds. Assess coated surfaces for thickness, hydrophobicity, and topography, in addition to kinetic processes (association and dissociation) and binding affinity. Evaluate particle size and charge. Analzye hard and soft materials for strength and durability.

Instruments include: tensile strength tester, contact angle imager, imaging ellipsometer, spin coater, quartz crystal microbalance (QCM with dissipation), dynamic light scattering (DLS; and Zeta potential), particle visualization microscope (PVM), fourier transform infrared (FTIR) spectrometer with microscope, and an imaging and scanning X-ray photoelectron spectrometer (XPS).