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X-Ray Photoelectron Spectrometer (XPS)

Surface Characterization

Overview

The Quantum II Imaging and Scanning X-Ray Photoelectron Spectrometer (XPS; PHI Electronics) uses mono-energetic x-rays to irradiate a sample, causing photoelectrons to be emitted from the surface. The binding energy and intensity of photoelectron peaks are detected and can provide elemental identity, chemical state information, and elemental quantification.

This instrument is technician run. Samples are to be submitted for analysis.

Instrument Uses

  • Element Identification
  • Element Quantification
  • Chemical State Analysis
  • High-Throughput

Sample Integrity

  • Non-Destructive

Requirements

  • No Liquids
  • Preferred pre-degassed
  • If on solid substrate, less than 75 mm × 75 mm