This suite features an Imaging and Scanning X-ray Photoelectron Spectrometer (XPS) Microprobe (PHI, Quantera II) which allows for large and small area spectroscopy as well as high-throughput XPS on microarrays.

A Fourier Transform Infrared (FTIR) Spectrometer and Microscope (Bruker, Vertex 70, Hyperion 3000) capable performing molecular analysis and imaging.

Other instruments compliment material and surface characterization (tensile strength, contact angle imager, imaging Ellipsometer, Spin Coater, Quartz Crystal Microbalance with Dissipation), along with those for characterization of particle size, shape and charge (Dynamic Light Scattering, Particle Visualization Microscope, Focused Beam Reflective Measurer). .